G. K. Zhavnerko, V. E. Agabekov, M. O. Gallyamov I. V. Yaminsky, I. V. Lokot, F. A. Lachvich
The influence of the chemical structure of film-forming material, the pressure of deposition, and the nature of substrate upon the film morphology has been studied by atomic force microscopy (AFM). The conclusion was made that crystallization processes were more clearly revealed for molecules with two tails, indicating on the high interaction energy between such molecules.
Conference proceedings of Third Belarussian seminar on scanning probe microscopy. Grodno, Oktober 1998. pp.91-93.